Delft 2010

joint company tour to VSL and TNO  


                                       

              www.vsl.nl                                      www.tno.nl      
    

Date:  Friday 4th June 2010

On Friday 4th June a joint tour will be available to the Netherlands Organisation for Applied Scientific Research (TNO) and the Dutch National Metrology Institute (VSL).

TNO is an independent research organisation whose expertise and research in high tech systems and materials make an important contribution to the competitiveness of companies and organisations. Their mission is to apply scientific knowledge with the aim of strengthening the innovative power of industry and government.

VSL is a private company with expertise in customized applied metrology; research and development plus calibration and reference materials.

 Programme 

08.45* Coach departs with  delegates booked on the tour from in front of the monument of King William II at the Buitenhof in the Hague
09.10 to 09.15* Coach will pick up delegates booked on the tour who are staying in Delft, from the Hampshire Hotel
 09.30  Arrival at VSL with coffee and tea
10.00  Welcome by Director of VSL and short introduction
10.15 Overview of Dimensional Metrology at VSL - activities of the Dimensional Metrology group at VSL
10.45

Visit to the VSL Nanolab

Visit to the lab facilities with poster presentations and live demonstrations at four sites: 

  • Site1: Metrology for high-precision parts (F25 micro-CMM and/or Form Lab)

  • Site 2 : Metrology on a nanometer scale (Atomic Force Microscope and/or Fabry-Perot interferometer)

  • Site 3 : Primary standards (frequency comb and applications)

  • Site 4: RAD 3D facility in the optics laboratory
12.30 Buffet Lunch
13.45 Arrival at TNO with coffee and tea
14.00 Welcome by the director of TNO Science and Industry with a short introduction to TNO
14.15 Overview of the activities of the business unit 'High End Equipment'

Including a screening of the movie ‘North Sea Nano’
14.30

Visit the Van Leeuwenhoek Laboratory at three sites:

  • Site 1: NANOMEFOS Nonometre Accuracy Non-contact Measurement of Freeform Optical Surfaces
  • Site 2: GAIA AFMA - is the name for a ground-based calibration instrument for testing the Gaia satellite payload in a large vacuum chamber
  •  Site 3: Visit of the optical workshop
16.00
End of Visit
16.15* Departure by coach to Delft Railway Station
 
* Times are approximate and will be confirmed at a later date.