Detailed Programme >>>
Session Chairmen:
Prof. J. van Eijk, University of Delft
Dr. J. Benschop, ASML, NL
Dr. H. Bosse, PTB, DE
Dr. H. Haitjema, Mitutoyo Research Centre, NL
Prof. P. Shore, Cranfield Univesity, UK
Mr. R. Nefkens, Hembrug, NL
Prof. K. Carlisle, Lawrence Livermore National Laboratory, USA
Prof. D. Reynaerts, KU Leuven, BE
Mr. D. Arneson, Professional Instruments, US
Dr. K. Beckstette, Zeiss, DE
Mr. M. Tricard, QED Technologies, US
Prof. T. Moriwaki, Kobe University, JP
Dr. P. Subrahmanyan, Rapt Industries, US
Dr. W. T. Estler, NIST, US
Prof. H. Van Brussel, KU Leuven, BE
Prof. L. de Chiffre, Denmark Technical University, DK
Prof. S. Zelenika, University of Rijek, CR
Dr. W. Knapp, ETH, CH
Dr K. Carneiro, DFM, DK
Mr T. Peijnenburg, VDL Enabling Technologies Group, NL